- Built with original high quality DRAM chips and rigorously subjected to long term stability testing for enterprise reliability.
- Delivers significantly higher fault tolerance and data correction capabilities compared to standard ECC UDIMMs.
- Extensively tested with mainstream server platforms to complete comprehensive Intel and AMD platform compatibility testing.
- Features a high-density architecture with 32 internal banks organized into 8 groups of 4 banks each for maximized data throughput.
- Equipped with an integrated serial presence detect (SPD) EEPROM for accurate system identification and optimized configuration.
- Utilizes premium gold edge contacts to ensure superior signal transmission quality and long-lasting connection durability.
- Integrates advanced On-Die ECC technology and a Registering Clock Driver to detect and correct memory errors in real time.
- Operates at a highly efficient 1.1V to minimize enterprise power consumption and reduce thermal output in data centres.
- Includes a dedicated Power Management IC (PMIC) for precise localized voltage regulation and enhanced signal stability.